Bulk substrates with a self-aligned buried polycrystalline layer
Structures with altered crystallinity beneath semiconductor devices and methods associated with forming such structures. Trench isolation regions surround an active device region composed of a single-crystal semiconductor material. A first non-single-crystal layer is arranged beneath the trench isol...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
13.12.2022
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Subjects | |
Online Access | Get full text |
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Summary: | Structures with altered crystallinity beneath semiconductor devices and methods associated with forming such structures. Trench isolation regions surround an active device region composed of a single-crystal semiconductor material. A first non-single-crystal layer is arranged beneath the trench isolation regions and the active device region. A second non-single-crystal layer is arranged beneath the trench isolation regions and the active device region. The first non-single-crystal layer is arranged between the second non-single-crystal layer and the active device region. |
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Bibliography: | Application Number: US202017086925 |