Schema inference and log data validation system

Systems and methods are described for generating metrics from log data items, automatically inferring one or more schemas based at least in part on analyzing samples of the log data items, validating samples of the log data items against the one or more schemas to detect log data item errors, and an...

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Bibliographic Details
Main Authors Bugdayci, Ahmet, Singh, Sahibdeep, Wei, Linda, Rodriguez, Mario Sergio
Format Patent
LanguageEnglish
Published 20.09.2022
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Systems and methods are described for generating metrics from log data items, automatically inferring one or more schemas based at least in part on analyzing samples of the log data items, validating samples of the log data items against the one or more schemas to detect log data item errors, and analyzing the log data item errors according to metrics analytics rules to determine an effect of the log data item errors on a quality measurement of the metrics.
Bibliography:Application Number: US202117155670