Reducing program verifies for multi-level NAND cells
Over time, the number of write cycles required to successfully program a multi-level cell (MLC) is reduced. Since a hard-coded value does not change over the lifetime of the device, the device may perform too many verify steps at one stage of the device lifetime and wait too long to begin verificati...
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| Main Authors | , , |
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| Format | Patent |
| Language | English |
| Published |
16.08.2022
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| Subjects | |
| Online Access | Get full text |
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| Abstract | Over time, the number of write cycles required to successfully program a multi-level cell (MLC) is reduced. Since a hard-coded value does not change over the lifetime of the device, the device may perform too many verify steps at one stage of the device lifetime and wait too long to begin verification at another stage of the device lifetime, reducing performance of the device. As discussed herein, verification for higher voltage level programming is delayed until verification for lower voltage level programming reaches at least a threshold level of success instead of using a hard-coded number of verify steps to skip. As a result, the performance drawbacks associated with skipping a hard-coded number of verify cycles may not occur. |
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| AbstractList | Over time, the number of write cycles required to successfully program a multi-level cell (MLC) is reduced. Since a hard-coded value does not change over the lifetime of the device, the device may perform too many verify steps at one stage of the device lifetime and wait too long to begin verification at another stage of the device lifetime, reducing performance of the device. As discussed herein, verification for higher voltage level programming is delayed until verification for lower voltage level programming reaches at least a threshold level of success instead of using a hard-coded number of verify steps to skip. As a result, the performance drawbacks associated with skipping a hard-coded number of verify cycles may not occur. |
| Author | Nevill, Jason Lee Vali, Tommaso McNeil, Jeffrey S |
| Author_xml | – fullname: Nevill, Jason Lee – fullname: McNeil, Jeffrey S – fullname: Vali, Tommaso |
| BookMark | eNrjYmDJy89L5WQwCUpNKU3OzEtXKCjKTy9KzFUoSy3KTMtMLVZIyy9SyC3NKcnUzUktS81R8HP0c1FITs3JKeZhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfGhwYaGJobmJgZmTkbGxKgBAAowLi4 |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences Physics |
| ExternalDocumentID | US11417406B2 |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_US11417406B23 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 13:14:26 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_US11417406B23 |
| Notes | Application Number: US202016907594 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&CC=US&NR=11417406B2 |
| ParticipantIDs | epo_espacenet_US11417406B2 |
| PublicationCentury | 2000 |
| PublicationDate | 20220816 |
| PublicationDateYYYYMMDD | 2022-08-16 |
| PublicationDate_xml | – month: 08 year: 2022 text: 20220816 day: 16 |
| PublicationDecade | 2020 |
| PublicationYear | 2022 |
| RelatedCompanies | Micron Technology, Inc |
| RelatedCompanies_xml | – name: Micron Technology, Inc |
| Score | 3.405743 |
| Snippet | Over time, the number of write cycles required to successfully program a multi-level cell (MLC) is reduced. Since a hard-coded value does not change over the... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING INFORMATION STORAGE PHYSICS STATIC STORES |
| Title | Reducing program verifies for multi-level NAND cells |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220816&DB=EPODOC&locale=&CC=US&NR=11417406B2 |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwFD6MeX3Tqui8EEH6Vtwlq-tDEXtjCOvGtsreRpOlsCHdsBX_vueEzvmirwmEJOTL-XLy5QvAw0KpjGzKLEFXu9wWmUUeLJbiyrEVX8iWpIT-ILb7CX-ddWc1WG3fwmif0C9tjoiIkoj3Uu_Xm10SK9DayuJRLLFo_RxN3cCsTsftNv0jYQaeG46GwdA3fd9NJmY8dpH2I_du2h5u13tEo8lnP3zz6FXK5ndIiU5gf4St5eUp1FRuwJG__XnNgMNBdeFtwIFWaMoCCysUFmfAx-S3ijGHVeoqhutxmeGZlyEFZVojaL2TGojFL3HAKDlfnMN9FE79voUdmf-Mep5Mdn3uXEA9X-fqElhHPmVNR6QIJsV7qZNmsqeQKAlEouqqxRU0_m6n8V_lNRzTDFLCtGXfQL38-FS3GHFLcaen6hteEoT3 |
| link.rule.ids | 230,309,786,891,25594,76906 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bS8MwFD6MeZlvWhWdtwjSt-IuXbc-FLHtStW1G1srexu9pDCRbtiKf99zQud80dcEQhLy5Xw5-fIF4C7lPCObMiWmq11VizOFPFgUrnJd42qatBNK6Hu-5obq87w3r8Hb5i2M8An9EuaIiKgE8V6K_Xq9TWLZQltZ3MdLLFo9OIFhy9XpuNOhfyRk2zSGk7E9tmTLMsKZ7E8NpP3IvVuaidv1Tp_ceYk6vZr0KmX9O6Q4h7A7wdby8ghqPJegYW1-XpNg36suvCXYEwrNpMDCCoXFMahT8lvFmMMqdRXD9bjM8MzLkIIyoRFU3kkNxPxH32aUnC9O4NYZBparYEcWP6NehLNtn7unUM9XOT8D1k36WUuPIwQTVweRHmXJgCNRihGJvMfTc2j-3U7zv8obaLiBN1qMnvyXCzig2aTkaVu7hHr58cmvMPqW8bWYtm--Wofk |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Reducing+program+verifies+for+multi-level+NAND+cells&rft.inventor=Nevill%2C+Jason+Lee&rft.inventor=McNeil%2C+Jeffrey+S&rft.inventor=Vali%2C+Tommaso&rft.date=2022-08-16&rft.externalDBID=B2&rft.externalDocID=US11417406B2 |