Methods for processing semiconductor wafers having a polycrystalline finish

A method of processing a semiconductor wafer includes depositing a silicon layer on the semiconductor wafer. The silicon layer has a substantially uniform thickness. The silicon layer is polished to smooth the silicon layer such that the thickness is substantially uniform after polishing.

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Bibliographic Details
Main Authors Crooks, Mark, Ragan, Tracy Michelle, Zhang, Guoqiang David
Format Patent
LanguageEnglish
Published 07.06.2022
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Summary:A method of processing a semiconductor wafer includes depositing a silicon layer on the semiconductor wafer. The silicon layer has a substantially uniform thickness. The silicon layer is polished to smooth the silicon layer such that the thickness is substantially uniform after polishing.
Bibliography:Application Number: US202016946283