Methods for processing semiconductor wafers having a polycrystalline finish
A method of processing a semiconductor wafer includes depositing a silicon layer on the semiconductor wafer. The silicon layer has a substantially uniform thickness. The silicon layer is polished to smooth the silicon layer such that the thickness is substantially uniform after polishing.
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
07.06.2022
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Subjects | |
Online Access | Get full text |
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Summary: | A method of processing a semiconductor wafer includes depositing a silicon layer on the semiconductor wafer. The silicon layer has a substantially uniform thickness. The silicon layer is polished to smooth the silicon layer such that the thickness is substantially uniform after polishing. |
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Bibliography: | Application Number: US202016946283 |