Detection of fields

A field detector (2) comprises a field-responsive element (10) which undergoes a dimensional change when exposed to a predetermined field; and an interferometric read-out arrangement arranged to detect the dimensional change of the field-responsive element. A light source (4) is arranged to provide...

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Bibliographic Details
Main Authors Kolberg, Sigbjørn, Gjessing, Jo, Knudsen, Sverre, Skokic, Zeljko, Johansen, Ib-Rune, Lacolle, Matthieu, Stamnes, Øyvind Nistad, Vogl, Andreas, Hjelstuen, Magnus Blihovde
Format Patent
LanguageEnglish
Published 07.06.2022
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING ELECTRIC VARIABLES
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING MAGNETIC VARIABLES
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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Summary:A field detector (2) comprises a field-responsive element (10) which undergoes a dimensional change when exposed to a predetermined field; and an interferometric read-out arrangement arranged to detect the dimensional change of the field-responsive element. A light source (4) is arranged to provide a measurement beam reflected from the field-responsive element (10) and a reference beam not reflected from the field-responsive element (10), an optical detector (6) being disposed so as to detect at least part of an interference pattern produced by the measurement beam and the reference beam. The field-responsive element (10) has a shape comprising a curved surface and is constrained at least one edge (12) thereof such that the dimensional change causes the curved surface to be displaced in a direction which changes an optical path length of the measurement beam relative to the reference beam, thereby changing the interference pattern detected by said optical detector.
Bibliography:Application Number: US201816755067