Method of designing a layout, method of making a semiconductor structure and semiconductor structure
A method of designing a layout includes determining a first layout pattern, wherein the first layout pattern corresponds to a plurality of contact pads. The method further includes generating a second layout pattern. The method further includes checking whether an edge of the second layout pattern o...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
19.04.2022
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Subjects | |
Online Access | Get full text |
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Summary: | A method of designing a layout includes determining a first layout pattern, wherein the first layout pattern corresponds to a plurality of contact pads. The method further includes generating a second layout pattern. The method further includes checking whether an edge of the second layout pattern overlaps the first layout pattern. The method further includes adjusting the second layout pattern so that the edge of the second layout pattern overlaps the first layout pattern in response to a determination that the edge of the second layout pattern is separated from the first layout pattern. |
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Bibliography: | Application Number: US202016904176 |