Multiphotonic microscopy method and device

• Main Authors: Hanna, Marc, Abdeladim, Lamiae, Guesmi, Khmaies, Druon, Frédéric, Supatto, Willy, Mahou, Pierre, Beaurepaire, Emmanuel, Rigaud, Philippe
• Format: Patent
• Language: English
• Published: 22.02.2022
• Subjects: BASIC ELECTRIC ELEMENTS; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING; DEVICES USING STIMULATED EMISSION; ELECTRICITY; FREQUENCY-CHANGING; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; NON-LINEAR OPTICS; OPTICAL ANALOGUE/DIGITAL CONVERTERS; OPTICAL LOGIC ELEMENTS; OPTICS; PHYSICS; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; TESTING

The invention relates to a device comprising:a laser source emitting a first beam with a central wavelength λ1 lying between 1010 nm and 1050 nm,a spectral supercontinuum generator downstream of the laser source, generating a second beam with a central wavelength λ2 lying between 1670 nm and 1730 nm from a part of the first beam,an optical parametric amplification system downstream of the spectral supercontinuum generator, generating a third beam with a central wavelength λ3 lying between 2540 nm and 2690 nm from at least a part of the second beam and a part of the first beam, anda second harmonic generator downstream of the optical parametric amplification system, the second harmonic generator generating a fourth beam with a central wavelength λ4 lying between 1270 nm and 1345 nm from at least a part of the third beam.