ESD protection charge pump active clamp for low-leakage applications

Disclosed examples include an electrostatic discharge protection circuit including a shunt transistor coupled between first and second power supply nodes, a sensing circuit to deliver a control voltage signal to turn on the shunt transistor in response to a detected change in a voltage of the first...

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Bibliographic Details
Main Authors Farbiz, Farzan, Di Sarro, James P
Format Patent
LanguageEnglish
Published 07.09.2021
Subjects
BASIC ELECTRIC ELEMENTS
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
GENERATION
SEMICONDUCTOR DEVICES
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Summary:Disclosed examples include an electrostatic discharge protection circuit including a shunt transistor coupled between first and second power supply nodes, a sensing circuit to deliver a control voltage signal to turn on the shunt transistor in response to a detected change in a voltage of the first power supply node resulting from an ESD stress event, and a charge pump circuit to boost the control voltage signal in response to the control voltage signal turning the shunt transistor on.
Bibliography:Application Number: US201916511332