Semiconductor device, method of manufacturing semiconductor device, inverter circuit, driving device, vehicle, and elevator
A semiconductor device according to an embodiment includes: a SiC layer having a first plane, a second plane, a first trench located on a first plane side, an n-type first SiC region, a p-type second SiC region between the first SiC region and the first plane, an n-type third SiC region between the...
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Format | Patent |
Language | English |
Published |
20.07.2021
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Subjects | |
Online Access | Get full text |
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Abstract | A semiconductor device according to an embodiment includes: a SiC layer having a first plane, a second plane, a first trench located on a first plane side, an n-type first SiC region, a p-type second SiC region between the first SiC region and the first plane, an n-type third SiC region between the second SiC region and the first plane, and a p-type fourth SiC region between the first SiC region and the first plane, at least a portion of the fourth SiC region located in the second SiC region, the fourth SiC region having a higher p-type impurity concentration than the second SiC region; a gate electrode in the first trench; a first electrode located on the first plane side; and a second electrode located on a second plane side. A depth of the fourth SiC region increases with distance from the first trench. |
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AbstractList | A semiconductor device according to an embodiment includes: a SiC layer having a first plane, a second plane, a first trench located on a first plane side, an n-type first SiC region, a p-type second SiC region between the first SiC region and the first plane, an n-type third SiC region between the second SiC region and the first plane, and a p-type fourth SiC region between the first SiC region and the first plane, at least a portion of the fourth SiC region located in the second SiC region, the fourth SiC region having a higher p-type impurity concentration than the second SiC region; a gate electrode in the first trench; a first electrode located on the first plane side; and a second electrode located on a second plane side. A depth of the fourth SiC region increases with distance from the first trench. |
Author | Kimoto, Shinichi Iijima, Ryosuke Tanaka, Katsuhisa Kyogoku, Shinya |
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Snippet | A semiconductor device according to an embodiment includes: a SiC layer having a first plane, a second plane, a first trench located on a first plane side, an... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | Semiconductor device, method of manufacturing semiconductor device, inverter circuit, driving device, vehicle, and elevator |
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