Universal process kit

The implementations described herein generally relate to a process kit suitable for use in a semiconductor process chamber, which reduces edge effects and widens the processing window with a single edge ring as compared to conventional process kits. The process kit generally includes an edge ring di...

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Bibliographic Details
Main Authors Rogers, James, Joubert, Olivier, Kenney, Jason A, Achutharaman, Vedapuram S, Luere, Olivier, Srinivasan, Sunil, Dhindsa, Rajinder
Format Patent
LanguageEnglish
Published 29.06.2021
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Summary:The implementations described herein generally relate to a process kit suitable for use in a semiconductor process chamber, which reduces edge effects and widens the processing window with a single edge ring as compared to conventional process kits. The process kit generally includes an edge ring disposed adjacent to and surrounding a perimeter of a semiconductor substrate in a plasma chamber. A dimension of a gap between the substrate and the edge ring is less than about 1000 μm, and a height difference between the substrate and the edge ring is less than about (+/−) 300 μm. The resistivity of the ring is less than about 50 Ohm-cm.
Bibliography:Application Number: US201715436936