Semiconductor device and a method for fabricating the same
A semiconductor device includes a substrate having a first conductivity type, a first well formed in the substrate and having a second conductivity type, a first diffusion region formed in the first well and having the first conductivity type, a first interlayer dielectric layer disposed over the fi...
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Main Authors | , , , |
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Format | Patent |
Language | English |
Published |
01.06.2021
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device includes a substrate having a first conductivity type, a first well formed in the substrate and having a second conductivity type, a first diffusion region formed in the first well and having the first conductivity type, a first interlayer dielectric layer disposed over the first well and the first diffusion region, and a resistor wire formed of a conductive material and embedded in the first interlayer dielectric layer. The resistor wire overlaps the first diffusion region and at least partially overlaps the first well in plan view. |
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Bibliography: | Application Number: US202016914528 |