IC, driver IC, display system, and electronic device

A test circuit is incorporated in an IC without an increase in a chip area. The IC includes a plurality of pins, a plurality of current sensing circuits, and a current generation circuit. The plurality of current sensing circuits process currents flowing through the plurality of pins in parallel and...

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Bibliographic Details
Main Author Yamamoto, Roh
Format Patent
LanguageEnglish
Published 18.05.2021
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