IC, driver IC, display system, and electronic device

A test circuit is incorporated in an IC without an increase in a chip area. The IC includes a plurality of pins, a plurality of current sensing circuits, and a current generation circuit. The plurality of current sensing circuits process currents flowing through the plurality of pins in parallel and...

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Bibliographic Details
Main Author Yamamoto, Roh
Format Patent
LanguageEnglish
Published 18.05.2021
Subjects
ADVERTISING
ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION
BASIC ELECTRIC ELEMENTS
CRYPTOGRAPHY
DISPLAY
EDUCATION
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEALS
SEMICONDUCTOR DEVICES
TESTING
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Summary:A test circuit is incorporated in an IC without an increase in a chip area. The IC includes a plurality of pins, a plurality of current sensing circuits, and a current generation circuit. The plurality of current sensing circuits process currents flowing through the plurality of pins in parallel and generates digital data, for example. The current generation circuit includes a capacitor and generates a reference current corresponding to the amount of electric charge of the capacitor. The amount of electric charge can be controlled by a voltage input to the capacitor, and thus the range of output currents for current generation can be made wide. The reference current is used for testing the plurality of current sensing circuits. The IC is used for a source driver IC of a display panel, for example. In this case, currents flowing through pixels in the display panel can be sensed by the plurality of current sensing circuits.
Bibliography:Application Number: US201816490956