Training, validating, and monitoring artificial intelligence and machine learning models

• Main Authors: Deo, Arati, Ghosh, Bhaskar, Venkataraman, Mahesh, Fernandes, Mallika, Escrig, Teresa, Durg, Kishore P
• Format: Patent
• Language: English
• Published: 27.04.2021
• Subjects: CALCULATING; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS; COMPUTING; COUNTING; PHYSICS

A device identifies training data and scoring data for a model, and removes bias from the training data to generate unbiased training data. The device trains the model with the unbiased training data to generate trained models, and processes the trained models, with the scoring data, to generate scores for the trained models. The device selects a trained model, from the trained models, based on model metrics and the scores, and processes a training sample, with the trained model, to generate first results, wherein the training sample is created based on the unbiased training data and production data. The device processes a production sample, with the trained model, to generate second results, wherein the production sample is created based on the production data and the training sample. The device provides the trained model for use in a production environment based on the first results and the second results.