Abnormality diagnostic system

Provided is an abnormality diagnosis system with which it is possible to express the propagation relationship of effects among areas, and to easily determine the area that is the factor causing a state that differs from normal operation, even when there is an extremely large number of devices in a f...

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Bibliographic Details
Main Author Kageyama, Kouji
Format Patent
LanguageEnglish
Published 13.04.2021
Subjects
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Summary:Provided is an abnormality diagnosis system with which it is possible to express the propagation relationship of effects among areas, and to easily determine the area that is the factor causing a state that differs from normal operation, even when there is an extremely large number of devices in a facility. The present invention has a state change detection means that has a plurality of detection units set for each area of a facility and that detects state changes from changes in the relationship of a plurality of operation data items pertaining to the areas monitored by the detection units. The area that is the cause of a state change at the facility is estimated on the basis of the state change detection results of the detection units of the state change detection means, and on the basis of information about the relationships between the detection units, the information containing the propagation relationship of effects among the areas of the facility that correspond to the detection units.
Bibliography:Application Number: US201716068054