System and method for monitoring changes in process dynamic behavior by mapping parameters to a lower dimensional space

A method includes acquiring process data collected in an industrial process control and automation system. The method also includes reducing a dimension space of the process data by combining two or more parameters of the process data or examining a frequency response of the process data. The method...

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Bibliographic Details
Main Authors Forbes, Michael, Stewart, Gregory E, Backstrom, Johan
Format Patent
LanguageEnglish
Published 13.04.2021
Subjects
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
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Summary:A method includes acquiring process data collected in an industrial process control and automation system. The method also includes reducing a dimension space of the process data by combining two or more parameters of the process data or examining a frequency response of the process data. The method further includes determining a change in a process based on a change in the process data in the reduced dimension space. The method also includes outputting a result based on the determined change in the process.
Bibliography:Application Number: US201916294812