System-on-chip for at-speed test of logic circuit and operating method thereof

• Main Authors: Shin, Beom Seok, Park, Jinsoo
• Format: Patent
• Language: English
• Published: 06.04.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A system-on-chip includes a first scan register being in a first core and being closest to an input port of the first core; an inverting circuit on a feedback path of the first scan register; a second scan register in the first core; and a logic circuit on a data path between the first scan register and the second scan register. In a test mode for an AT-SPEED test of the logic circuit, the inverting circuit generates test data by inverting scan data that are output from the first scan register, the first scan register stores the test data in response to a first pulse of a clock signal, the logic circuit generates result data based on the test data that are output from the first scan register, and the second scan register stores the result data in response to a second pulse of the clock signal.