Hardness testing system using multiple depth measurements and related methods

An apparatus includes a holder to support an indenter relative to a sample, a depth sensor, and a controller. The operations include applying a first force on the sample with the indenter and determining a first depth of the indenter based on data generated by the sensor, moving the indenter from th...

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Bibliographic Details
Main Authors Smullin, Sylvia Joan, Grundmann, Michael Jason
Format Patent
LanguageEnglish
Published 06.04.2021
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:An apparatus includes a holder to support an indenter relative to a sample, a depth sensor, and a controller. The operations include applying a first force on the sample with the indenter and determining a first depth of the indenter based on data generated by the sensor, moving the indenter from the first depth to a greater predetermined depth, then applying the first force on the sample with the indenter and determining a second depth of the indenter based on second data generated by the sensor, and determining a value indicative of hardness of the sample based on a difference between the first depth and the second depth. The apparatuses described can use a single scale for hardness that enables hardness values for different materials to be compared to one another.
Bibliography:Application Number: US201816103147