Semiconductor device

A polycrystalline silicon resistor is large in coefficient of fluctuation in resistance between before and after the completion of a package molding process. To enable highly accurate trimming, it is desired to implement a resistor that is hardly subjected to stress produced in a substrate during a...

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Bibliographic Details
Main Authors Tsuneno, Katsumi, Yayama, Kosuke, Hashimoto, Chiemi, Matsuzaki, Tomokazu
Format Patent
LanguageEnglish
Published 23.03.2021
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Summary:A polycrystalline silicon resistor is large in coefficient of fluctuation in resistance between before and after the completion of a package molding process. To enable highly accurate trimming, it is desired to implement a resistor that is hardly subjected to stress produced in a substrate during a package molding process. A resistance element is formed of a plurality of wiring layers and has a repetitive pattern of a first conductive layer formed in a first wiring layer, a second conductive layer formed in a second wiring layer, and an interlayer conductive layer coupling the first conductive layer and the second conductive layer together.
Bibliography:Application Number: US201816004014