Tool measuring device having independent head tilt and alignment and hybrid pantograph-to-optical inner diameter measurement

The present invention teaches a punch and die measurement device which includes a linear array LED micrometer arranged so that the light beams and shadows pass vertically from transmitters to receivers, and further teaches a 1:1 ratio pantograph for transferring measurements from inside of a necker...

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Bibliographic Details
Main Authors Goldsmith, Christopher Dale, Wiebe, Ryan Caleb, Lord, Richard Lamar, Johnson, Adam Brian
Format Patent
LanguageEnglish
Published 16.02.2021
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:The present invention teaches a punch and die measurement device which includes a linear array LED micrometer arranged so that the light beams and shadows pass vertically from transmitters to receivers, and further teaches a 1:1 ratio pantograph for transferring measurements from inside of a necker die to outside the die where it may then be measured by the linear array LED micrometers. The invention may include a precision alignment block, captive adjustment screws to adjust tilt plates angle of the linear array measurement carriage and lever arms to reduce motion of the adjustment screws as applied to the tilt plates.
Bibliography:Application Number: US202016795513