System and method for modeling and correcting frequency of quartz crystal oscillator

• Main Authors: Li, Kuangmin, Babitch, Daniel
• Format: Patent
• Language: English
• Published: 09.02.2021
• Subjects: ANALOGOUS ARRANGEMENTS USING OTHER WAVES; AUTOMATIC CONTROL, STARTING, SYNCHRONISATION, OR STABILISATIONOF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES; BASIC ELECTRONIC CIRCUITRY; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; ELECTRICITY; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES; MEASURING; MEASURING QUANTITY OF HEAT; MEASURING TEMPERATURE; PHYSICS; RADIO DIRECTION-FINDING; RADIO NAVIGATION; TESTING; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR

A method and system for generating a crystal model for a test product including a crystal oscillator are herein disclosed. The method includes measuring a first temperature of the test product and measuring a first frequency error of the crystal oscillator at a first calibration point during a product testing process, measuring a second temperature of the test product and measuring a second frequency error of the crystal oscillator at a second calibration point during the product testing process, estimating two parameters from the first temperature, first frequency error, second temperature, and second frequency error, and determining a 3rd order polynomial for the crystal model based on the two parameters.