SAR ADC with variable sampling capacitor
A successive approximation register analog-to-digital converter (SAR ADC) circuit comprises N weighted bit capacitors, wherein N is a positive integer greater than one; a sampling circuit configured to sample an input voltage onto the N weighted bit capacitors; and logic circuitry. The logic circuit...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
26.01.2021
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Subjects | |
Online Access | Get full text |
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Summary: | A successive approximation register analog-to-digital converter (SAR ADC) circuit comprises N weighted bit capacitors, wherein N is a positive integer greater than one; a sampling circuit configured to sample an input voltage onto the N weighted bit capacitors; and logic circuitry. The logic circuitry is configured to enable sampling of the input voltage onto the N weighted bit capacitors in a high-resolution mode; enable sampling of the input voltage onto N−M of the weighted bit capacitors in a low-resolution mode and sampling a common mode voltage onto the most significant M weighted bit capacitors, wherein M is a positive integer greater than zero and less than N; and initiate successive bit trials using the weighted bit capacitors to convert the sampled input voltage to a digital value. |
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Bibliography: | Application Number: US202016791717 |