Semiconductor inspection jig

• Main Authors: Ikeda, Daisuke, Koyanagi, Motoyoshi, Sasano, Kazuhiro, Taniuchi, Tomohito, Kobayashi, Yuji, Kitagawa, Tetsuya, Kubota, Masayuki
• Format: Patent
• Language: English
• Published: 19.01.2021
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

A semiconductor inspection jig includes: a base on which a semiconductor device is placed; and a substrate provided on the base and including a conductive pattern, wherein the conductive pattern intersects with a lead of the semiconductor device placed on the base from a direction other than a horiz...