Semiconductor inspection jig

A semiconductor inspection jig includes: a base on which a semiconductor device is placed; and a substrate provided on the base and including a conductive pattern, wherein the conductive pattern intersects with a lead of the semiconductor device placed on the base from a direction other than a horiz...

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Bibliographic Details
Main Authors Ikeda, Daisuke, Koyanagi, Motoyoshi, Sasano, Kazuhiro, Taniuchi, Tomohito, Kobayashi, Yuji, Kitagawa, Tetsuya, Kubota, Masayuki
Format Patent
LanguageEnglish
Published 19.01.2021
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A semiconductor inspection jig includes: a base on which a semiconductor device is placed; and a substrate provided on the base and including a conductive pattern, wherein the conductive pattern intersects with a lead of the semiconductor device placed on the base from a direction other than a horizontal direction with respect to the lead, and is in contact with an intermediate part of the lead without being in contact with a leading end of the lead.
Bibliography:Application Number: US201715679186