Semiconductor inspection jig
A semiconductor inspection jig includes: a base on which a semiconductor device is placed; and a substrate provided on the base and including a conductive pattern, wherein the conductive pattern intersects with a lead of the semiconductor device placed on the base from a direction other than a horiz...
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Main Authors | , , , , , , |
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Format | Patent |
Language | English |
Published |
19.01.2021
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor inspection jig includes: a base on which a semiconductor device is placed; and a substrate provided on the base and including a conductive pattern, wherein the conductive pattern intersects with a lead of the semiconductor device placed on the base from a direction other than a horizontal direction with respect to the lead, and is in contact with an intermediate part of the lead without being in contact with a leading end of the lead. |
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Bibliography: | Application Number: US201715679186 |