System and method to diagnose integrated circuit

A diagnostic system includes: a processor, arranged to extract a plurality of coordinates of a plurality of pins on an outer surface of a design layout according to a plurality of tagging texts labeling the plurality of pins respectively, and arranged to generate a design exchange format file accord...

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Bibliographic Details
Main Authors Cheng, Hong-Chen, Hsu, Hsin-Wu, Changchien, Wei-Pin, Lin, Pei-Ying
Format Patent
LanguageEnglish
Published 15.12.2020
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A diagnostic system includes: a processor, arranged to extract a plurality of coordinates of a plurality of pins on an outer surface of a design layout according to a plurality of tagging texts labeling the plurality of pins respectively, and arranged to generate a design exchange format file according to the plurality of coordinates, wherein an order of the plurality of tagging texts are sorted by a predetermined scanning sequence; and a chip diagnostic tool, arranged to scan the plurality of scan components in a physical circuit on a testing platform through the plurality of pins on the outer surface of the physical circuit by following the predetermined scanning sequence to determine a defect component in the physical circuit according to the design exchange format file; wherein the physical circuit corresponds to the design layout.
Bibliography:Application Number: US201916389804