Value addition dependent data mining techniques for assembly lines

Methods, systems, and apparatuses for performing target parameter analysis for an assembly line including a plurality of stations. One method includes receiving, with an electronic processor, training data associated with the assembly line. The training data including a plurality of attributes. The...

Full description

Saved in:
Bibliographic Details
Main Authors Hong, Charmgil, Ghosh, Rumi, Srinivasan, Soundararajan
Format Patent
LanguageEnglish
Published 27.10.2020
Subjects
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
Online AccessGet full text

Cover

More Information
Summary:Methods, systems, and apparatuses for performing target parameter analysis for an assembly line including a plurality of stations. One method includes receiving, with an electronic processor, training data associated with the assembly line. The training data including a plurality of attributes. The method also includes receiving, with the electronic processor, value addition data for each of the plurality of stations. The value addition data for each of the plurality of stations specifying a non-negative value added by each of the plurality of stations. The method also includes learning, with the electronic processor, a decision tree based on the training data and the value addition data. The method also includes performing the target parameter analysis based on the decision tree.
Bibliography:Application Number: US201615342677