Technique for determining performance characteristics of electronic devices and systems

A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second...

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Bibliographic Details
Main Authors Liaw, Haw-Jyh, Horowitz, Mark A, Yuan, Xingchao
Format Patent
LanguageEnglish
Published 22.09.2020
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
TRANSMISSION
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Summary:A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
Bibliography:Application Number: US201815957864