Semiconductor device and method for manufacturing same

A semiconductor device has a semiconductor layer and a substrate. The semiconductor layer constitutes at least a part of a current path, and is made of silicon carbide. The substrate has a first surface supporting the semiconductor layer, and a second surface opposite to the first surface. Further,...

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Bibliographic Details
Main Authors Nishiguchi, Taro, Harada, Shin, Miyazaki, Tomihito, Wada, Keiji, Okita, Kyoko, Sasaki, Makoto
Format Patent
LanguageEnglish
Published 11.08.2020
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Summary:A semiconductor device has a semiconductor layer and a substrate. The semiconductor layer constitutes at least a part of a current path, and is made of silicon carbide. The substrate has a first surface supporting the semiconductor layer, and a second surface opposite to the first surface. Further, the substrate is made of silicon carbide having a 4H type single-crystal structure. Further, the substrate has a physical property in which a ratio of a peak strength in a wavelength of around 500 nm to a peak strength in a wavelength of around 390 nm is 0.1 or smaller in photoluminescence measurement. In this way, the semiconductor device is obtained to have a low on-resistance.
Bibliography:Application Number: US201815918652