Illumination source for structured illumination microscopy
An illumination system and a method for operating an illumination system is disclosed. The illumination system includes a generator spatial light modulator, first and second optical systems and a controller. The generator spatial light modulator is positioned to receive an incident light beam and ad...
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Main Author | |
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Format | Patent |
Language | English |
Published |
14.07.2020
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Subjects | |
Online Access | Get full text |
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Summary: | An illumination system and a method for operating an illumination system is disclosed. The illumination system includes a generator spatial light modulator, first and second optical systems and a controller. The generator spatial light modulator is positioned to receive an incident light beam and adapted to generate first and second coherent light beams, each beam being characterized by a phase and a first light beam optical axis in a plane containing the first and second coherent light beams. The first optical system images light leaving the generator spatial light modulator on a modulator spatial light modulator that alters the phase of one of the first and second coherent light beams to generate a relative phase difference. The second optical system that images light leaving the modulator spatial light modulator onto a sample to be illuminated. The controller causes the relative phase difference to cycle through a plurality of different phase-difference values. |
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Bibliography: | Application Number: US201715785157 |