Calibration of multiple analog front-ends

• Main Authors: Lo, Steve Chikin, Bohannon, Eric Scott, Kwan, Keung Kwok
• Format: Patent
• Language: English
• Published: 28.04.2020
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

Methods and associated processing systems are disclosed for acquiring gain mismatch values and offset mismatch values corresponding to a plurality of analog-to-digital converters (ADCs). One method comprises coupling receiver circuitry of a processing system with a capacitive sensor comprising a plurality of sensor electrodes, the receiver circuitry comprising a plurality of ADCs, each ADC of the plurality of ADCs coupled with one or more respective sensor electrodes of the plurality of sensor electrodes. The method further comprises, while at least a portion of transmitter circuitry of the processing system is disabled, acquiring measurements using each ADC of the plurality of ADCs; and storing, using the acquired measurements, a plurality of offset mismatch values in a memory of the processing system. The processing system is operable to apply the plurality of offset mismatch values to capacitive measurements acquired using the plurality of ADCs.