Automatic machine-learning high value generator

A processor-implemented method for generating a test suite within a time requirement is provided. The processor-implemented method includes executing a rule selection operation to determine candidate test cases utilizing attributes corresponding to each of the candidate test cases to produce selecte...

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Bibliographic Details
Main Authors Lee, Chien Pang, Kuo, Jeff H C, Hsiung, Wei-Hsiang, Lee, John K C
Format Patent
LanguageEnglish
Published 07.04.2020
Subjects
CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:A processor-implemented method for generating a test suite within a time requirement is provided. The processor-implemented method includes executing a rule selection operation to determine candidate test cases utilizing attributes corresponding to each of the candidate test cases to produce selected test cases. The processor-implemented method includes determining whether an estimated testing execution time of the selected test cases is equal to or less than the time requirement. The processor-implemented method includes generating the test suite based on the selected test cases when the estimated testing execution time is equal to or less than the time requirement.
Bibliography:Application Number: US201715685852