Forming stacked twin III-V nano-sheets using aspect-ratio trapping techniques

A semiconductor structure that includes: a substrate, a twin vertical punch-through stopper layer structure connected to the substrate, and a plurality of nanosheets connected to and supported by the twin vertical punch-through stopper structure and isolated from the substrate by an insulating diele...

Full description

Saved in:
Bibliographic Details
Main Authors Khojasteh, Mahmoud, Reznicek, Alexander, Hashemi, Pouya, Balakrishnan, Karthik
Format Patent
LanguageEnglish
Published 28.01.2020
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:A semiconductor structure that includes: a substrate, a twin vertical punch-through stopper layer structure connected to the substrate, and a plurality of nanosheets connected to and supported by the twin vertical punch-through stopper structure and isolated from the substrate by an insulating dielectric.
Bibliography:Application Number: US201715834721