Analog circuit fault diagnosis method using single testable node

• Main Authors: Sun, Yesheng, He, Yigang, Cheng, Zhen, Wu, Lei, Long, Ying, Zhao, Deqin, Yuan, Lifen, Zhang, Chaolong, Yuan, Zhijie
• Format: Patent
• Language: English
• Published: 21.01.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An analog circuit fault diagnosis method using a single testable node comprises the following steps: (1) obtaining prior sample data vectors under each fault mode; (2) computing a statistical average of the prior sample data vectors under each of the fault modes; (3) decomposing a signal by an ortho...