Analog circuit fault diagnosis method using single testable node

• Main Authors: Sun, Yesheng, He, Yigang, Cheng, Zhen, Wu, Lei, Long, Ying, Zhao, Deqin, Yuan, Lifen, Zhang, Chaolong, Yuan, Zhijie
• Format: Patent
• Language: English
• Published: 21.01.2020
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

An analog circuit fault diagnosis method using a single testable node comprises the following steps: (1) obtaining prior sample data vectors under each fault mode; (2) computing a statistical average of the prior sample data vectors under each of the fault modes; (3) decomposing a signal by an orthogonal Haar wavelet filter set; (4) extracting the feature factor of the prior sample fault modes; (5) extracting a fault-mode-to-be-tested feature factor; (6) computing a correlation coefficient matrix and correlation metric parameters between the feature factor of the prior sample fault modes and the feature factor of the fault-mode-to-be-tested; and (7) determining a fault mode according to a maximal correlation principle by comparing the correlation metric parameters. The method can convert a single signal into a plurality of signals without losing original measurement information, and extract an independent fault mode feature factor reflecting variations of a circuit structure in different fault modes, can be used to study an associated mode determination rule and successfully complete classification of circuit fault modes.