Rinse composition, a method for forming resist patterns and a method for making semiconductor devices

The present invention relates to a new rinse composition, the forming of resist patterns using the rinse composition, and a semiconductor device manufacturing method using the rinse composition in a photolithography method.

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Bibliographic Details
Main Authors Yashima, Tomoyasu, Yamamoto, Kazuma, Nagahara, Tatsuro, Matsuura, Yuriko
Format Patent
LanguageEnglish
Published 22.10.2019
Subjects
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Summary:The present invention relates to a new rinse composition, the forming of resist patterns using the rinse composition, and a semiconductor device manufacturing method using the rinse composition in a photolithography method.
Bibliography:Application Number: US201716308168