Method for determining system reliability of a logic circuit

A method for determining system reliability of a logic circuit, wherein a functional component model for design/simulation of a circuit model of the logic circuit is created, where functional components model are expanded by adding an associated power model, a temperature model, and a reliability, w...

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Bibliographic Details
Main Authors Cech, Christian, Fischer, Bernhard, Matschnig, Martin, Hinterstoisser, Thomas
Format Patent
LanguageEnglish
Published 09.07.2019
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:A method for determining system reliability of a logic circuit, wherein a functional component model for design/simulation of a circuit model of the logic circuit is created, where functional components model are expanded by adding an associated power model, a temperature model, and a reliability, where the logic circuit is constructed with expanded model components and, based on simulation of the logic circuit aided by the constructed circuit model, a functional, a power-dependent, and a temperature-dependent behavior and a temperature-dependent failure rate are derived for each component in a component specific manner for a specified application case, and where in addition to the functional behavior, a power and temperature behavior and a total failure rate can be determined simply and dynamically, based on the derived data and dependent on temperature and simulation time for the logic circuit for the specified application case.
Bibliography:Application Number: US201515328321