Bandgap reference voltage failure detection

An integrated circuit is provided with a bandgap voltage reference circuit having a bandgap reference voltage output. A bandgap failure detection circuit is coupled to the bandgap reference voltage output. The bandgap failure detection forms a model value of the reference voltage from a first time,...

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Bibliographic Details
Main Authors Gerber, Johannes, Arnold, Matthias, Dornseifer, Frank
Format Patent
LanguageEnglish
Published 09.07.2019
Subjects
BASIC ELECTRONIC CIRCUITRY
CONTROLLING
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
PULSE TECHNIQUE
REGULATING
SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
TESTING
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Summary:An integrated circuit is provided with a bandgap voltage reference circuit having a bandgap reference voltage output. A bandgap failure detection circuit is coupled to the bandgap reference voltage output. The bandgap failure detection forms a model value of the reference voltage from a first time, compares a present value of the reference voltage at a second time to the model value; and asserts a bandgap fail signal to indicate when the present value is less than the model value by a threshold value. The integrated circuit is reset by the bandgap fail signal. The detection circuit may be operated from a failsafe voltage domain that also allows a critical circuit to complete a pending operation during a reset.
Bibliography:Application Number: US201715427854