Alignment key design rule check for correct placement of abutting cells in an integrated circuit

Methods and a computer program product are described for placing, by an electronic design tool, a first alignment key shape of a first cell and a second alignment key shape of a second cell positioned on a common edge where the first cell abuts the second cell in a physical layout design. An abuttin...

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Bibliographic Details
Main Authors Chan, Nigel, Bossu, Germain
Format Patent
LanguageEnglish
Published 04.06.2019
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Methods and a computer program product are described for placing, by an electronic design tool, a first alignment key shape of a first cell and a second alignment key shape of a second cell positioned on a common edge where the first cell abuts the second cell in a physical layout design. An abutting alignment key shape is formed by placement of the first alignment key shape and the second alignment key shape in the physical layout design. The abutting alignment key shape is checked by a design rule to identify a disallowed cell placement of the first cell relative to the second cell when the abutting alignment key shape does not form a pre-defined shape of a correct size. The disallowed cell placement is corrected, by a designer, through substitution of an allowed cell placement to provide a corrected physical layout design for manufacture of the IC.
Bibliography:Application Number: US201715670158