Capacitor order determination in an analog-to-digital converter

An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacit...

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Bibliographic Details
Main Authors Fuchs, Thomas, Ruck, Bernhard Wolfgang, Kuhn, Rudiger
Format Patent
LanguageEnglish
Published 21.05.2019
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Summary:An analog-to-digital converter (ADC) includes a digital-to-analog converter (DAC) that has a configurable capacitor array. Based on measurements of differential nonlinearity (DNL) and/or integral nonlinearity (INL) error by an external test computer system, an order for use of the DAC's capacitors can be determined so as to reduce DNL error aggregation, also called INL. The DAC includes a switch matrix that can be programmed by programming data supplied by the test computer system.
Bibliography:Application Number: US201715483046