Synchronized test master

Systems, methods, and other embodiments associated with a synchronized test master are described. In one embodiment, a method periodically synchronizing test master data to a source database by, at a synchronization time: modifying the test master data to reflect changes to the source database since...

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Bibliographic Details
Main Authors Wong, Adrienne, Venkataramani, Aruna, Das, Sreeji, Komali, Chandra
Format Patent
LanguageEnglish
Published 22.01.2019
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Systems, methods, and other embodiments associated with a synchronized test master are described. In one embodiment, a method periodically synchronizing test master data to a source database by, at a synchronization time: modifying the test master data to reflect changes to the source database since a last synchronization time; populating a transaction log with data manipulation operations performed on the source database since a last transaction time; and taking a snapshot of the test master data. Synchronization data is derived from the transaction log that includes a snapshot time for the snapshot and a modification time for each data manipulation operation in the transaction log. The method includes storing the synchronization data and snapshot for use in generating a test database that represents a point-in-time version of the source database.
Bibliography:Application Number: US201514953902