Semiconductor device and manufacturing method thereof
A semiconductor device includes first channel layers disposed over a substrate, a first source/drain region disposed over the substrate, a gate dielectric layer disposed on and wrapping each of the first channel layers, a gate electrode layer disposed on the gate dielectric layer and wrapping each o...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
25.12.2018
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Subjects | |
Online Access | Get full text |
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Summary: | A semiconductor device includes first channel layers disposed over a substrate, a first source/drain region disposed over the substrate, a gate dielectric layer disposed on and wrapping each of the first channel layers, a gate electrode layer disposed on the gate dielectric layer and wrapping each of the first channel layers, and a liner semiconductor layer disposed between the first channel layers and the first source/drain region. |
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Bibliography: | Application Number: US201615064402 |