Semiconductor device and manufacturing method thereof

A semiconductor device includes first channel layers disposed over a substrate, a first source/drain region disposed over the substrate, a gate dielectric layer disposed on and wrapping each of the first channel layers, a gate electrode layer disposed on the gate dielectric layer and wrapping each o...

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Bibliographic Details
Main Authors Ching, Kuo-Cheng, Leung, Ying-Keung, Fung, Ka-Hing
Format Patent
LanguageEnglish
Published 25.12.2018
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Summary:A semiconductor device includes first channel layers disposed over a substrate, a first source/drain region disposed over the substrate, a gate dielectric layer disposed on and wrapping each of the first channel layers, a gate electrode layer disposed on the gate dielectric layer and wrapping each of the first channel layers, and a liner semiconductor layer disposed between the first channel layers and the first source/drain region.
Bibliography:Application Number: US201615064402