Contact corrosion mitigation

Methods, structures, and apparatus that limit the amount of dendritic growth and metal migration between contacts in order to prevent an erroneous detection of a connection and/or functional failure. One example may reduce dendritic growth and metal migration by limiting an amount of time that a con...

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Bibliographic Details
Main Authors Daniel, Christophe B, Keeler, Kevin M, Whitby-Strevens, Colin
Format Patent
LanguageEnglish
Published 30.10.2018
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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Summary:Methods, structures, and apparatus that limit the amount of dendritic growth and metal migration between contacts in order to prevent an erroneous detection of a connection and/or functional failure. One example may reduce dendritic growth and metal migration by limiting an amount of time that a connection detection voltage is applied to CC contacts of a USB Type-C connector when an electronic device is detecting a connection. This and other examples may further limit dendritic growth by not applying the connection detection voltage to the CC contacts for a first duration following a detection of a disconnection.
Bibliography:Application Number: US201615243824