Apparatus and methods for calibrating analog circuitry in an integrated circuit

The present disclosure provides apparatus and methods for the calibration of analog circuitry on an integrated circuit. One embodiment relates to a method of calibrating analog circuitry within an integrated circuit. A microcontroller that is embedded in the integrated circuit is booted up. A reset...

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Bibliographic Details
Main Authors Carvalho, Neville, Shumarayev, Sergey, Hoang, Tim Tri
Format Patent
LanguageEnglish
Published 23.10.2018
Subjects
CONSTRUCTIONAL DETAILS OF INSTRUMENTS, OR COMPARABLE DETAILSOF OTHER APPARATUS, NOT OTHERWISE PROVIDED FOR
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
INSTRUMENT DETAILS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
TRANSMISSION
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Summary:The present disclosure provides apparatus and methods for the calibration of analog circuitry on an integrated circuit. One embodiment relates to a method of calibrating analog circuitry within an integrated circuit. A microcontroller that is embedded in the integrated circuit is booted up. A reset control signal is sent to reset an analog circuit in the integrated circuit, and a response signal for the analog circuit is monitored by the microcontroller. Based on the response signal, a calibration parameter for the analog circuit is determined, and the analog circuit is configured using the calibration parameter. Other embodiments, aspects and features are also disclosed.
Bibliography:Application Number: US201213446555