Method of fabricating tunnel transistors with abrupt junctions

A method of manufacturing a tunnel field effect transistor (TFET) includes forming on a substrate covered by an epitaxially grown source material a dummy gate stack surrounded by sidewall spacers; forming doped source and drain regions followed by forming an inter-layer dielectric surrounding the si...

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Bibliographic Details
Main Authors Vega, Reinaldo A, Yuan, Xiaobin, Alptekin, Emre, Tran, Hung H
Format Patent
LanguageEnglish
Published 16.10.2018
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Online AccessGet full text

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Summary:A method of manufacturing a tunnel field effect transistor (TFET) includes forming on a substrate covered by an epitaxially grown source material a dummy gate stack surrounded by sidewall spacers; forming doped source and drain regions followed by forming an inter-layer dielectric surrounding the sidewall spacers; removing the dummy gate stack, etching a self-aligned cavity; epitaxially growing a thin channel region within the self-aligned etch cavity; conformally depositing gate dielectric and metal gate materials within the self-aligned etch cavity; and planarizing the top surface of the replacement metal gate stack to remove the residues of the gate dielectric and metal gate materials.
Bibliography:Application Number: US201213459278