Method for detecting defects in conductive materials based on differences in magnetic field characteristics measured along the conductive materials

A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second...

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Main Authors Stetson, Jr., John B, Villani, Jr., Joseph A
Format Patent
LanguageEnglish
Published 02.10.2018
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Abstract A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second portion of the length of material. The method further includes determining that the material includes a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude.
AbstractList A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second portion of the length of material. The method further includes determining that the material includes a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude.
Author Villani, Jr., Joseph A
Stetson, Jr., John B
Author_xml – fullname: Stetson, Jr., John B
– fullname: Villani, Jr., Joseph A
BookMark eNqNjT0OwjAUgzvAwN8dHgdAKn9SZxCIhQmYq0fitJHalypJuQgXJiBGBiZb1md7nA3ECUbZ84xYO03GedKIUNFKlZxJLpAVUk50n9IHqOUIb7kJdOcATU5IW2PgIQofuOVKEK0iY9FoUjV7Vu9SSGGgFhx6n5rcuPQSa_ycn2ZDkwSzr06y-fFw3Z8W6FyJ0LFCeilvl2WeF8Vmu9qt1v8wL4-jUwU
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID US10088452B2
GroupedDBID EVB
ID FETCH-epo_espacenet_US10088452B23
IEDL.DBID EVB
IngestDate Fri Jul 19 16:41:18 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_US10088452B23
Notes Application Number: US201615003145
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181002&DB=EPODOC&CC=US&NR=10088452B2
ParticipantIDs epo_espacenet_US10088452B2
PublicationCentury 2000
PublicationDate 20181002
PublicationDateYYYYMMDD 2018-10-02
PublicationDate_xml – month: 10
  year: 2018
  text: 20181002
  day: 02
PublicationDecade 2010
PublicationYear 2018
RelatedCompanies Lockheed Martin Corporation
RelatedCompanies_xml – name: Lockheed Martin Corporation
Score 3.1735547
Snippet A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field...
SourceID epo
SourceType Open Access Repository
SubjectTerms INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title Method for detecting defects in conductive materials based on differences in magnetic field characteristics measured along the conductive materials
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181002&DB=EPODOC&locale=&CC=US&NR=10088452B2
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dS8MwED_G_HzTqej8IIL0rTi3tLQPRVi7MYR94DbZ20iTdExcOlzFP8R_2EvWOgX1raTlSpNe7neXu98B3IhagwsnqdncYYlNY5HYjKHj6rvUo57jSyZ1QL_bcztj-jBxJiV4LmphDE_ouyFHRI3iqO-Z2a-XmyBWZHIrV7fxHIfS-_YoiKzcO0ZzhRpuRc2gNehH_dAKw2A8tHqPgeaw8ahTb-J2vaVhtObZbz01dVXK8rtJaR_A9gClqewQSlJVYC8sOq9VYLebH3hXYMdkaPIVDuZauDqCj65p-0wQbxIh9SkA2h-8MpkZZK4I-riaxhU3MoKAdP2PEW2vBEkVKXqioCz98ILNlK5kJCaZjfCfDM5ksQ4iCsJeUnwL4sVfxR_Ddbs1Cjs2fuf0a1Kn4-FmShonUFapkqdA4li6Ah1s744nVPrSd4VgiNK8GJEZ9fkZVP-WU_3v5jns6wUyiXD1Cyhnr2_yEg16Fl-ZlfgE9B-qUw
link.rule.ids 230,309,786,891,25594,76903
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1bT8IwFD4heME3RY3irSZmb4sI29weFhM2CCoDImB4I13bGYx0RGb8If5hTwuIJurb0jVnWdtz-U7PBeCCl6uM20nZZDZNTCvmiUkpAlfPsVzLtT1BhXLoR22nObDuhvYwB8_LXBhdJ_RdF0dEjmLI75mW19OVEyvUsZWzy3iMQ-lNo--HxgIdo7pCDjfCml_vdsJOYASBP-gZ7Qdf1bBxLbtSQ3G9do2QUEOlx5rKSpl-VymNbVjvIjWZ7UBOyCIUgmXntSJsRosL7yJs6AhNNsPBBRfOduEj0m2fCdqbhAt1C4D6B590ZAYZS4IYV5VxRUFG0CCdnzGi9BUnqSTLnihIS02e0CepMhmJDmYj7GcFZzKZOxE5oS8pfgXtxV_J78F5o94Pmib-5-hrUUeD3mpJqvuQl6kUB0DiWDgcAbZ7xRJLeMJzOKdopbkxWmaWxw6h9Ded0n8vz6DQ7EetUeu2fX8EW2qzdFBc5Rjy2eubOEHlnsWnelc-ARF-rT0
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=Method+for+detecting+defects+in+conductive+materials+based+on+differences+in+magnetic+field+characteristics+measured+along+the+conductive+materials&rft.inventor=Stetson%2C+Jr.%2C+John+B&rft.inventor=Villani%2C+Jr.%2C+Joseph+A&rft.date=2018-10-02&rft.externalDBID=B2&rft.externalDocID=US10088452B2