Method for detecting defects in conductive materials based on differences in magnetic field characteristics measured along the conductive materials
A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second...
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
02.10.2018
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Subjects | |
Online Access | Get full text |
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Summary: | A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second portion of the length of material. The method further includes determining that the material includes a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude. |
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Bibliography: | Application Number: US201615003145 |