Method for detecting defects in conductive materials based on differences in magnetic field characteristics measured along the conductive materials

A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second...

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Bibliographic Details
Main Authors Stetson, Jr., John B, Villani, Jr., Joseph A
Format Patent
LanguageEnglish
Published 02.10.2018
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:A method includes passing a magnetometer along a length of a material. The method also includes measuring, via the magnetometer, a first magnetic field magnitude along a first portion of the length of the material and measuring, via the magnetometer, a second magnetic field magnitude along a second portion of the length of material. The method further includes determining that the material includes a defect along the second portion of the length of material by determining that the first magnetic field magnitude is different than the second magnetic field magnitude.
Bibliography:Application Number: US201615003145