Apparatus and method for scanning a structure

An apparatus and method for scanning a structure for detecting variations in density of a structure, the apparatus (10) includes: a source of radiation (20); a plurality of detectors (30), arranged for receiving radiation emitted by the source along a plurality of respective paths (26); the apparatu...

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Bibliographic Details
Main Authors Featonby, Paul David, Ronchi, Emanuele
Format Patent
LanguageEnglish
Published 11.09.2018
Subjects
GAMMA RAY OR X-RAY MICROSCOPES
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
IRRADIATION DEVICES
MEASURING
NUCLEAR ENGINEERING
NUCLEAR PHYSICS
PHYSICS
TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR
TESTING
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Summary:An apparatus and method for scanning a structure for detecting variations in density of a structure, the apparatus (10) includes: a source of radiation (20); a plurality of detectors (30), arranged for receiving radiation emitted by the source along a plurality of respective paths (26); the apparatus configured such that, a structure (100) to be scanned is positionable between the detectors and the source; collimation elements (40) including a plurality of collimator channels (42), each located between a respective detector and the source; and collimation adjustment element (60). The apparatus, in a first configuration, provides a first resolution (r1) in an axial direction substantially orthogonal to a plane including the source and plurality of paths; and, in a second configuration, the collimation adjustment element is positioned between the collimation elements and the source such that the apparatus provides a second resolution (r2) in the axial direction; wherein r2<r1.
Bibliography:Application Number: US201515305387