Sample holder for scanning electron microscopy (SEM) and atomic force microscopy (AFM)

The capacity of preserving the location reference of the details for both microscopies, in the scope of correlational microscopy, results essential to obtain information and images in both fields of microscopy, which can be correlated in order to acquire valuable combined information.

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Bibliographic Details
Main Authors Velázquez Cruz, David, Leyte Guerrero, Florentino, Acosta Garate, Galicia Mabel, Sadott Pacheco y Alcalá, Ubaldo
Format Patent
LanguageEnglish
Published 17.07.2018
Subjects
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES
MEASURING
NANOTECHNOLOGY
PERFORMING OPERATIONS
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES
TESTING
TRANSPORTING
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Summary:The capacity of preserving the location reference of the details for both microscopies, in the scope of correlational microscopy, results essential to obtain information and images in both fields of microscopy, which can be correlated in order to acquire valuable combined information.
Bibliography:Application Number: US201615374969