Apparatus for measuring expansion ratio of substrates and sorting substrates

An apparatus for measuring expansion ratio of substrates and sorting substrates is provided, which includes a measurement device, an output device, and a mover device. The measurement device is configured to take an image of the substrate, calculate an expansion ratio of the substrate according to t...

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Bibliographic Details
Main Authors HUANG, WEI-HAO, HSIEH, PEIIA, HU, CHIH-KAI, YU, FENG-TSAN, LIN, YAO-HUNG, SHYU, DEH-MING, CHANG, WEI-WHIH
Format Patent
LanguageChinese
English
Published 01.01.2021
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Summary:An apparatus for measuring expansion ratio of substrates and sorting substrates is provided, which includes a measurement device, an output device, and a mover device. The measurement device is configured to take an image of the substrate, calculate an expansion ratio of the substrate according to the image, and print measurement information on the substrate by laser, wherein the measurement information includes the expansion ratio. The output device defines a plurality of positions for storing the substrate, wherein each position corresponds to a different range of expansion ratios. The mover device is configured to move the substrate from the input device to the measurement device and/or move the substrate from the measurement device to the position in the output device corresponding to the range including the expansion ratio of the substrate.
Bibliography:Application Number: TW20209210917U