Automatic probe pick-and-place apparatus and automatic probe pick-and-place machine

An automatic probe pick-and-place apparatus comprises: a base; a base plate disposed with a through hole in a thickness direction; an air outlet needle located below the base plate and including an air outlet upwardly toward the through hole and distanced from the through hole; a multi-axis moving p...

Full description

Saved in:
Bibliographic Details
Main Authors SHEN, JUNGIN, CHUAN, KUO-PIN
Format Patent
LanguageChinese
English
Published 01.04.2020
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online AccessGet full text

Cover

More Information
Summary:An automatic probe pick-and-place apparatus comprises: a base; a base plate disposed with a through hole in a thickness direction; an air outlet needle located below the base plate and including an air outlet upwardly toward the through hole and distanced from the through hole; a multi-axis moving platform mounted on the base; a feeder mounted on the multi-axis moving platform and driven by the multi-axis moving platform to move between the air outlet and the through hole; a carrier mounted on one of the base and the multi-axis moving platform; a pneumatic nozzle pick-and-place means mounted on the multi-axis moving platform and driven by the multi-axis moving platform to arrive above the through hole and driven by the multi-axis moving platform to arrive above the carrier; a pneumatic source connected to the air outlet needle and the pneumatic nozzle pick-and-place means respectively; and a controller electrically connected to the pneumatic source and the multi-axis moving platform respectively.
Bibliography:Application Number: TW20198210671U